GTU BE/B.Tech 2019 Winter Question Papers || Gujarat Technological University
Subject Name: Materials Characterization
Time: 10:30 AM TO 01:00 PM
Date: 03/12/2019
Total Marks: 70
Subject Code: 2172109
GUJARAT TECHNOLOGICAL UNIVERSITY
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BE - SEMESTER- VII (New) EXAMINATION — WINTER 2019Subject Name: Materials Characterization
Time: 10:30 AM TO 01:00 PM
Date: 03/12/2019
Total Marks: 70
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Instructions:
- Attempt all questions.
- Make suitable assumptions wherever necessary.
- Figures to the right indicate full marks.
| Q.1 | (a) | Give significance of thermal analysis. | 03 |
| (b) | Describe the importance of Material characterization. | 04 | |
| (c) | Explain the principle and working of Rutherford backscattering spectroscopy (RBS). Write applications and limitations. | 07 | |
| Q.2 | (a) | Write different Vacuum range. | 03 |
| (b) | Write use of Vacuum systems in Material Characterization techniques. | 04 | |
| (c) | What are Vacuum gauge? Explain the principle and instrumentation of Pirani gauge with their merits, limitations and applications. | 07 | |
| OR | |||
| (c) | Discuss the Principle, Working and application of DTA. Give the difference between DSC and DTA. | 07 | |
| Q.3 | (a) | Discuss effect of Numerical Aperture on resolution of the microscope. | 03 |
| (b) | Write a note on Bright field microscopy. | 04 | |
| (c) | Describe the steps for microstructural study by image analysis. | 07 | |
| OR | |||
| (c) | What is Raman Effect? How it arises? | 07 | |
| Q.4 | (a) | Explain the principle of Differential Interference Contrast microscopy. | 03 |
| (b) | What do you mean by STM? Explain the principle and instrumentation. Give merits, limitations and applications: | 04 | |
| (c) | Explain how electron microscopy differs from optical microscopy. | 07 | |
| OR | |||
| (c) | Discuss Diffraction pattern in TEM. | 07 | |
| Q.5 | (a) | Draw schematic showing basic components of the scanning electron microscope. Briefly explain each component and its working in SEM. | 03 |
| (b) | What is basic difference between SEM and TEM? | 04 | |
| (c) | List advantages and applications of IR analysis. | 07 | |
| OR | |||
| (c) | What do you mean by AFM? Explain the principle and instrumentation. Give merits, limitations and applications. | 07 | |
| Q.6 | (a) | Write the advantages and disadvantages of Laue method of diffraction. | 03 |
| (b) | What is X-ray diffraction? How it is useful in material characterization? | 04 | |
| (c) | What is Atomic Emission Spectroscopy (AES)? Discuss various methods of Atomic Emission Spectroscopy. List advantages of AES. | 07 | |
| OR | |||
| (c) | Derive Bragg’s law. | 07 | |
| Q.7 | (a) | What are Auger electrons? How they produced? | 03 |
| (b) | Discuss Electron Probe Micro Analysis (EPMA) in terms of instrumentation and working principle using line diagram. | 04 |
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