Download GTU (Gujarat Technological University) BE/BTech (Bachelor of Engineering / Bachelor of Technology) 2018 Winter 3rd Sem New 2133904 Characterization Of Nanomaterials I Previous Question Paper
1
Seat No.: ________ Enrolment No.___________
GUJARAT TECHNOLOGICAL UNIVERSITY
BE - SEMESTER?III (New) EXAMINATION ? WINTER 2018
Subject Code: 2133904 Date: 12/12/2018
Subject Name: Characterization of Nanomaterials-I
Time: 10:30 AM TO 01:00 PM Total Marks: 70
Instructions:
1. Attempt all questions.
2. Make suitable assumptions wherever necessary.
3. Figures to the right indicate full marks.
MARKS
Q.1 (a) Explain Briefly Bragg?s Law. 03
(b) Describe different modes of AFM with Diagram. 04
(c) Write short note on Scanning Electron Microscope SEM.
(With Diagram)
07
Q.2 (a) Write down Components of AFM. 03
(b) Write down Advantages and Disadvantages of SEM. 04
(c) Explain Transmission Electron Microscope TEM. (With
Diagram)
07
OR
(c) Describe Advanced Optical Microscopy AOM. 07
Q.3 (a) Define Profilometry briefly. 03
(b) Describe Two Probe Method For Electrical
Measurement.
04
(c) Explain Working of Scanning Tunneling Microscope
STM.
07
OR
Q.3 (a) What Happens when a Non-Conducting Sample is placed
in the SEM and Which technique is used for the
measurement of data?
03
(b) Derive Bragg?s Law for XRD. 04
(c) Explain Working and Construction of X-Ray Diffraction
XRD with Diagram and how it is used to measure Particle
size.
07
Q.4 (a) Explain the Concept of Tunneling. 03
(b) Explain Drawbacks of Two Probe Method over Four
Probe Method.
04
(c) Describe Working and Principle of Atomic Force
Microscope AFM.
07
OR
Q.4 (a) Which Mode of AFM operation is responsible for
destruction of sample?
03
(b) What is Cantilever? In which Microscopy it is used? 04
(c) List out Application of SEM and TEM. 07
Q.5 (a) List out the components used in Four Probe Method with
Diagram.
03
(b) Define Conductivity, Resistivity, and Ohm?s Law with
Units.
04
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1
Seat No.: ________ Enrolment No.___________
GUJARAT TECHNOLOGICAL UNIVERSITY
BE - SEMESTER?III (New) EXAMINATION ? WINTER 2018
Subject Code: 2133904 Date: 12/12/2018
Subject Name: Characterization of Nanomaterials-I
Time: 10:30 AM TO 01:00 PM Total Marks: 70
Instructions:
1. Attempt all questions.
2. Make suitable assumptions wherever necessary.
3. Figures to the right indicate full marks.
MARKS
Q.1 (a) Explain Briefly Bragg?s Law. 03
(b) Describe different modes of AFM with Diagram. 04
(c) Write short note on Scanning Electron Microscope SEM.
(With Diagram)
07
Q.2 (a) Write down Components of AFM. 03
(b) Write down Advantages and Disadvantages of SEM. 04
(c) Explain Transmission Electron Microscope TEM. (With
Diagram)
07
OR
(c) Describe Advanced Optical Microscopy AOM. 07
Q.3 (a) Define Profilometry briefly. 03
(b) Describe Two Probe Method For Electrical
Measurement.
04
(c) Explain Working of Scanning Tunneling Microscope
STM.
07
OR
Q.3 (a) What Happens when a Non-Conducting Sample is placed
in the SEM and Which technique is used for the
measurement of data?
03
(b) Derive Bragg?s Law for XRD. 04
(c) Explain Working and Construction of X-Ray Diffraction
XRD with Diagram and how it is used to measure Particle
size.
07
Q.4 (a) Explain the Concept of Tunneling. 03
(b) Explain Drawbacks of Two Probe Method over Four
Probe Method.
04
(c) Describe Working and Principle of Atomic Force
Microscope AFM.
07
OR
Q.4 (a) Which Mode of AFM operation is responsible for
destruction of sample?
03
(b) What is Cantilever? In which Microscopy it is used? 04
(c) List out Application of SEM and TEM. 07
Q.5 (a) List out the components used in Four Probe Method with
Diagram.
03
(b) Define Conductivity, Resistivity, and Ohm?s Law with
Units.
04
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2
(c) Explain Resistivity Measurement through Four Probe
Method with Setup.
07
OR
Q.5 (a) Define Elliptical Polarized Light. 03
(b) Describe Advantages and Disadvantages of TEM. 04
(c) Write short note on Ellipsometry. (Construction and
Working with Diagram)
07
*************
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This post was last modified on 20 February 2020