Download GTU (Gujarat Technological University) BE/BTech (Bachelor of Engineering / Bachelor of Technology) 2018 Winter 7th Sem New 2172109 Materials Characterization Previous Question Paper
Seat No.: ________ Enrolment No.___________
GUJARAT TECHNOLOGICAL UNIVERSITY
BE - SEMESTER ?VII (NEW) EXAMINATION ? WINTER 2018
Subject Code: 2172109 Date: 29/11/2018
Subject Name: Materials Characterization
Time: 10:30 AM TO 01:00 PM Total Marks: 70
Instructions:
1. Attempt all questions.
2. Make suitable assumptions wherever necessary.
3. Figures to the right indicate full marks.
MARKS
Q.1 (a) What do you meant by thermal analysis? Give its significance. 03
(b) Describe the importance of Material characterization.
04
(c) Draw schematic showing basic components of the scanning electron
microscope. Briefly explain each component and its working in SEM.
07
Q.2 (a) Give the difference between Heat flux DSC and Power Compensated DSC. 03
(b) ?DSC is widely used in industrial settings as a quality control instrument?.
Comment.
04
(c) Explain the principle and instrumentation of Diffusion pumps with their
merits, limitations and applications.
07
OR
(c) What do you mean by Vacuum gauge? Explain the principle and
instrumentation of Ionization gauge with their merits, limitations and
applications.
07
Q.3 (a) Explain how electron microscopy differs from optical microscopy? 03
(b) What is Image Analysis? List the steps for microstructural study by image
analysis.
04
(c) Define Magnification of Microscope. Explain Hot Stage Microscopy. 07
OR
Q.3 (a) Explain resolution of Microscope using the formula. 03
(b) Describe the principle of Differential Interference Contrast (DIC)
microscopy.
04
(c) Write a note on High Resolution Electron Microscopy (HREM). 07
Q.4 (a) Discuss the advantages and disadvantages of powder diffraction method. 03
(b) Explain how polished cast iron sample can be studied Using ESCA. 04
(c) What do you mean by AFM? Explain the principle and instrumentation. Give
merits, limitations and applications.
07
OR
Q.4 (a) Discuss merits, limitations and applications of STM. 03
(b) Explain the principle and instrumentation of STM. 04
(c) Compare X-ray Photoelectron Spectroscopy and Auger Electron
Spectroscopy techniques.
07
Q.5 (a) What is Raman Effect? How it arises? 03
(b) With a neat sketch explain IR Spectrometer. 04
(c) What is XRF? With a block diagram explain the working of XRF system. 07
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Seat No.: ________ Enrolment No.___________
GUJARAT TECHNOLOGICAL UNIVERSITY
BE - SEMESTER ?VII (NEW) EXAMINATION ? WINTER 2018
Subject Code: 2172109 Date: 29/11/2018
Subject Name: Materials Characterization
Time: 10:30 AM TO 01:00 PM Total Marks: 70
Instructions:
1. Attempt all questions.
2. Make suitable assumptions wherever necessary.
3. Figures to the right indicate full marks.
MARKS
Q.1 (a) What do you meant by thermal analysis? Give its significance. 03
(b) Describe the importance of Material characterization.
04
(c) Draw schematic showing basic components of the scanning electron
microscope. Briefly explain each component and its working in SEM.
07
Q.2 (a) Give the difference between Heat flux DSC and Power Compensated DSC. 03
(b) ?DSC is widely used in industrial settings as a quality control instrument?.
Comment.
04
(c) Explain the principle and instrumentation of Diffusion pumps with their
merits, limitations and applications.
07
OR
(c) What do you mean by Vacuum gauge? Explain the principle and
instrumentation of Ionization gauge with their merits, limitations and
applications.
07
Q.3 (a) Explain how electron microscopy differs from optical microscopy? 03
(b) What is Image Analysis? List the steps for microstructural study by image
analysis.
04
(c) Define Magnification of Microscope. Explain Hot Stage Microscopy. 07
OR
Q.3 (a) Explain resolution of Microscope using the formula. 03
(b) Describe the principle of Differential Interference Contrast (DIC)
microscopy.
04
(c) Write a note on High Resolution Electron Microscopy (HREM). 07
Q.4 (a) Discuss the advantages and disadvantages of powder diffraction method. 03
(b) Explain how polished cast iron sample can be studied Using ESCA. 04
(c) What do you mean by AFM? Explain the principle and instrumentation. Give
merits, limitations and applications.
07
OR
Q.4 (a) Discuss merits, limitations and applications of STM. 03
(b) Explain the principle and instrumentation of STM. 04
(c) Compare X-ray Photoelectron Spectroscopy and Auger Electron
Spectroscopy techniques.
07
Q.5 (a) What is Raman Effect? How it arises? 03
(b) With a neat sketch explain IR Spectrometer. 04
(c) What is XRF? With a block diagram explain the working of XRF system. 07
2
OR
Q.5 (a) Write applications and limitations of Rutherford backscattering
spectroscopy.
03
(b) Explain the Secondary Ion mass spectrometry (SIMS). 04
(c) Explain briefly Laue method of diffraction. What are the advantages and
disadvantages of Laue method?
07
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This post was last modified on 20 February 2020