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GUJARAT TECHNOLOGICAL UNIVERSITY
BE - SEMESTER-III (New) EXAMINATION — WINTER 2018
Subject Code: 2133904 Date: 12/12/2018
Subject Name: Characterization of Nanomaterials-I
Time: 10:30 AM TO 01:00 PM Total Marks: 70
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Instructions:
- Attempt all questions.
- Make suitable assumptions wherever necessary.
- Figures to the right indicate full marks.
MARKS
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Q.1 (a) Explain Briefly Bragg’s Law. 03
(b) Describe different modes of AFM with Diagram. 04
(c) Write short note on Scanning Electron Microscope SEM. (With Diagram) 07
Q.2 (a) Write down Components of AFM. 03
(b) Write down Advantages and Disadvantages of SEM. 04
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(c) Explain Transmission Electron Microscope TEM. (With Diagram) 07
OR
(c) Describe Advanced Optical Microscopy AOM. 07
Q.3 (a) Define Profilometry briefly. 03
(b) Describe Two Probe Method For Electrical Measurement. 04
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(c) Explain Working of Scanning Tunneling Microscope STM. 07
OR
Q.3 (a) What Happens when a Non-Conducting Sample is placed in the SEM and Which technique is used for the measurement of data? 03
(b) Derive Bragg’s Law for XRD. 04
(c) Explain Working and Construction of X-Ray Diffraction XRD with Diagram and how it is used to measure Particle size. 07
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Q.4 (a) Explain the Concept of Tunneling. 03
(b) Explain Drawbacks of Two Probe Method over Four Probe Method. 04
(c) Describe Working and Principle of Atomic Force Microscope AFM. 07
OR
Q.4 (a) Which Mode of AFM operation is responsible for destruction of sample? 03
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(b) What is Cantilever? In which Microscopy it is used? 04
(c) List out Application of SEM and TEM. 07
Q.5 (a) List out the components used in Four Probe Method with Diagram. 03
(b) Define Conductivity, Resistivity, and Ohm’s Law with Units. 04
(c) Explain Resistivity Measurement through Four Probe Method with Setup. 07
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OR
Q.5 (a) Define Elliptical Polarized Light. 03
(b) Describe Advantages and Disadvantages of TEM. 04
(c) Write short note on Ellipsometry. (Construction and Working with Diagram) 07
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