Download PTU (I. K. Gujral Punjab Technical University) MSc -Chemistry 2nd Semester May 2019 51151 ADVANCED CHARACTERIZATION TECHNIQUES Question Paper.
Roll No. Total No. of Pages : 02
Total No. of Questions : 19
M.Sc. (Chemistry) (Campus) (2015 to 2017) (Sem.-2)
ADVANCED CHARACTERIZATION TECHNIQUES
Subject Code : CHL-414
M.Code : 51151
Time : 3 Hrs. Max. Marks : 70
INSTRUCTIONS TO CANDIDATES :
1. SECTION-A is COMPULSORY consisting of TEN questions carrying TWO marks
each.
2. SECTION-B contains SIX questions carrying FIVE marks each and students
have to attempt ALL questions.
3. SECTION-C contains THREE questions carrying TEN marks each and students
have to attempt any TWO questions.
SECTION-A
1. Why do we require coating in the analysis of samples in SEM?
2. Describe the factors that affect TGA analysis of sample.
3. Explain EDS and SADP processes in the case of SEM and TEM and discuss their brief
applications.
4. How rotating sample method is different from powder X-ray diffraction method?
Explain.
5. What do you mean by secondary, backscattered and augur electron in SEM? Which
information we get from analysis of signal from such electrons?
6. Which materials are currently used as electron gun in TEM and why?
7. HgC12 crystallizes in orthorhombic system. Using radiation with ? = 154 pm, the (100)
(010) and (001) reflections (first order) from HgCl
2
in an X-ray diffractometer occurs at
70 25', 30 28' and 100 23', respectively. If the density of the crystal is 5.42 cm
-3
, calculate
the dimensions of unit cell and the number of HgCl
2
molecules in the unit cell.
M (HgCl
2
) = 271.5 g/mol.
8. Differentiate between thermionic emission gun and field emission gun in respect to TEM.
9. Explain SAED and EDX process in respect to TEM and FESEM respectively.
10. How DTA technique is different from DSC? Write the main application of both the
techniques.
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1 | M-51151 (S39)-1709
Roll No. Total No. of Pages : 02
Total No. of Questions : 19
M.Sc. (Chemistry) (Campus) (2015 to 2017) (Sem.-2)
ADVANCED CHARACTERIZATION TECHNIQUES
Subject Code : CHL-414
M.Code : 51151
Time : 3 Hrs. Max. Marks : 70
INSTRUCTIONS TO CANDIDATES :
1. SECTION-A is COMPULSORY consisting of TEN questions carrying TWO marks
each.
2. SECTION-B contains SIX questions carrying FIVE marks each and students
have to attempt ALL questions.
3. SECTION-C contains THREE questions carrying TEN marks each and students
have to attempt any TWO questions.
SECTION-A
1. Why do we require coating in the analysis of samples in SEM?
2. Describe the factors that affect TGA analysis of sample.
3. Explain EDS and SADP processes in the case of SEM and TEM and discuss their brief
applications.
4. How rotating sample method is different from powder X-ray diffraction method?
Explain.
5. What do you mean by secondary, backscattered and augur electron in SEM? Which
information we get from analysis of signal from such electrons?
6. Which materials are currently used as electron gun in TEM and why?
7. HgC12 crystallizes in orthorhombic system. Using radiation with ? = 154 pm, the (100)
(010) and (001) reflections (first order) from HgCl
2
in an X-ray diffractometer occurs at
70 25', 30 28' and 100 23', respectively. If the density of the crystal is 5.42 cm
-3
, calculate
the dimensions of unit cell and the number of HgCl
2
molecules in the unit cell.
M (HgCl
2
) = 271.5 g/mol.
8. Differentiate between thermionic emission gun and field emission gun in respect to TEM.
9. Explain SAED and EDX process in respect to TEM and FESEM respectively.
10. How DTA technique is different from DSC? Write the main application of both the
techniques.
2 | M-51151 (S39)-1709
SECTION-B
11. What do you meant by electron microscopy? How you can improve magnification?
Discuss the main limitations of electron microscopy.
12. What are the different types of atomization methods? Describe the graphite furnace
method.
13. Explain the working of Atomic Force Microscopy (AFM) with neat sketch. What was the
need of AFM when Scanning Electron Microscope was available?
14. Explain the process occurs to determine the elemental composition of materials when
high-energy electron falls on to it. Which compounds are used as electron gun in electron
microscopy? Give examples.
15. Derive Bragg's equation and also write the applications of this equation.
16. Write four differences between Scanning Tunneling microscope (STM) and Atomic force
microscope (AFM).
SECTION-C
17. Explain working principle and instrumentation of the Scanning electron microscopy
(SEM) technique with neat diagram. How we can predict type of element present with the
help of SEM? Write four main applications of FESEM.
18. Explain working principle and instrumentation of the Atomic Absorption spectrometer
(AAS) technique with neat diagram. Also write main applications of AAS. Which lamp is
generally used in AAS and why?
19. How would you estimate the size of any powder sample using X-ray diffraction? The
density of Li metal is 0.53 g cm
-3
and the separation of the (100) planes of the metal is
350 pm. Determine whether the lattice is f.c.c. or b.c.c. M(Li) = 6.941 g mol
-1
.
NOTE : Disclosure of Identity by writing Mobile No. or Making of passing request on any
page of Answer Sheet will lead to UMC against the Student.
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This post was last modified on 05 December 2019