Download JNTUA M.Tech 2nd Sem 2019 Feb 17D06109 Test And Testability Question Paper

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Code: 17D06109

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M.Tech II Semester Supplementary Examinations January/February 2019

TEST & TESTABILITY

(Common to VLSI, VLSIS & VLSISD)

(For students admitted in 2017 only)

Time: 3 hours

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Max. Marks: 60

Answer all the questions

1. (a) Classify types of testing and explain in brief about them.
   (b) Explain in brief about bridging faults.

   OR

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2. (a) Explain about the types of testing of VLSI chips.
   (b) Explain in detail about temporary faults.
3. (a) Illustrate serial fault simulation for large number of faults.
   (b) Illustrate detective fault simulation using combinational circuit.

   OR

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4. (a) Explain about event driven simulation using combinational circuit.
   (b) Illustrate two valued deductive simulation with example.
5. (a) Explain concept of controllability and observability with the help of block diagram.
   (b) Compute the combinational SCOAP testability measures for the circuit that realizes an expression J = ((A+B)⊕E)+BC+D.
6. (a) Illustrate partial-scan design with s-graph.

   OR

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   (b) Explain about the properties of Ad-Hoc DFT methods and its difficulties too.
7. (a) Illustrate economic case for BIST.
   (b) Explain about the process of random pattern generation.

   OR

8. (a) Illustrate circular self-test path BIST architecture with example.
   

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   (b) Illustrate LFSR as signature analyzer.
9. (a) Explain boundary scan architecture with neat schematic.
   (b) Explain BYPASS and INTEST instructions in boundary scan description language.

   OR

10. (a) Explain about BDSL description components.
    

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    (b) Explain about ring configuration of TAP controller.

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